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AdV-EGO (Contamination Control)
d'angelo - 16:11 Monday 03 May 2021 (51612) Print this report
Replacement of dust contamination witness sample on SQB1

On Thursday 29/04/21 I removed the dust witness sample placed on SQB1 bench at the end of January (Logbook Entry 50608), and placed another 3" silicon wafer approximately at the same position, which should allow the wafer to be representative of the optics and not to interfere with operations on the bench (Figure 1). January wafer was just placed on the bench, while this time I fixed the wafer on the bench with 2 screws (Figure 2), so the weight on SQB1 might have changed. The goal is to monitor dust contamination on SQB1 under vacuum, and it's likely that I will remove it next time the bench is put in air. 

Please do not move the sample and report any activity that may need to be performed in the close proximity of it and may compromise its representability of the average cleanliness condition of its location.

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