At 14:00 LT, we went into the LL to perform a more detailed inspection of the EIB bench. We first put the beam in scan mode and blocked it at the LB output.

We then opened the bench controls and slightly moved the plexiglass tube leading to the SIB1 tower, as it appeared to be in slight contact with the bench. However, a comparison of the FFT signals before and after the intervention showed no significant change, suggesting that the contact was not the cause of the excess noise. No other obvious issues that could explain the increased noise were identified during the inspection.

We then unblocked the beam, re-locked the INJ system, and left the LL at approximately 14:40 LT.

Afterwards, we continued analysing the data. Paolo identified some LVDT signals, particularly the vertical 0 and 2 channels, that are significantly noisier than they were previously (see Fig. 1). A similar issue appears to have occurred in the past (see #57229), where the solution was to implement a low-pass filter to attenuate the excess noise.

It would therefore be useful to investigate whether this filter is still correctly implemented and functioning, or whether another issue is currently responsible for the additional LVDT noise.